High energy PIXE: A tool to characterize multi-layer thick samples
نویسندگان
چکیده
منابع مشابه
PIXE and XRF analysis of honey samples
The systematic determination of trace-element concentrations in honey samples was done by the PIXE method using a 2 MeV proton beam and by the total reflection XRF method. The different kinds of honey samples were collected in the period of spring–summer in three places of Poland: in the centre of Warsaw (a highly polluted region) and about 100 km east of Warsaw and 70 km southwest of Warsaw (a...
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ژورنال
عنوان ژورنال: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
سال: 2018
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2017.09.009